MDS-Onto combines concepts from all different the different ontologies in Materials Data Science
Broader concepts are typically rendered as parents in a concept hierarchy (tree).
has broader
Relates a concept to a concept that is more general in meaning.
An additional component or device such as crystal, gas cell, or sample holder, that enhances or modifies the functionality of the instrument.
Drying temperature in the evaporation process of film preparation.
measurement of the infrared radiation for baseline correction.
Material used to cover the rear of the module. E.g., TPT, Tedlar.
Multiple beamsplitter options are present such as KBr, XT-KBr, and Quartz
The cell efficiency measured by a current voltage process
A calibration setting that deteremines the irradiance level of a light source, typically determined by a reference cell
Technology used on the cell level, i.e., cell architecture. E.g., Al-BSF, PERC, PERT, MWT, IBC, SHJ.
The number of cells in series together per individual string. E.g., 60, 72, etc.
Which version of lead connection is used to connect panel. E.g, MC4, MC3, T4.
The process of adjusting the spectral data to account for any instrumental factor like baseline correction.
The current at max power measured by a current voltage process
DC current at the maximum power point under STC
The analysis method used on a raw dataset generated by a current voltage process
The raw current voltage data generated by a current voltage process
The file path of a dataset generated by a current voltage process
The author of a recipe for a current voltage process
The creation date for a current voltage process recipe
The file path for a current voltage process recipe
The identification number for a current voltage recipe
The parameters that resulted from the current voltage process
The datetime when a current voltage process was executed
A sample used in a current voltage process
The step size of the voltage for a current voltage process
A sensitive component that converts infrared radiation from the sample into an electrical signal for spectral analysis.
Type of solvent for thin-film preparation.
Tipped structures resulting from ductile failure
Polymer material used to hold front sheet and back sheet together. Eg., EVA, POE, etc.
An estimation of the stress amplification at the crack tip
The specific environmental factors and durations to which samples are subjected to before characterization.
The temperature set point of the chamber.
The type of exposure e.g. damp heat, cyclic UV, outdoors.
The ambient temperature of the room that a current voltage process is being performed in
The fill factor measured by a current voltage process
A NicoletFTIR-OpticalSpectroscopy for chemical analysis
An AgilentFTIR-OpticalSpectroscopy for chemical analysis
Method used to wire cells together. RIBBON, SHINGLED, WIRE
Specimen subclass for an individual interdigitated comb
Location on rear of module housing junction box(es). Location could be on module EDGE; CENTER or SPLIT are commonly seen on half-cell modules.
North/south position of a point on the Earth, decimal format
The amount of time data is acquired during flash pulses
The standard testing condition load voltage of a sample being measured
East/west position of a point on the Earth, decimal format
The maximum power point measured by a current voltage process
Chemical analysis carried out on the sample.
Front glass module anti-reflective coating. Boolean.
Electrical junction box for connection to the module
The materials used for each layer of the solar panel excluding cell components. Either glass on glass (GG), glass with backsheet GB), glass with transparent backsheet (GTB).
Measurements of a module taken at STC and 1000 W/m^2 irradiance
How the arrays are mounted (fixed, one axis tracker, two axis tracker, vertical, etc)
Current at maximum power point rated at STC.
Voltage at maximum power point rated at STC.
Number of busbars present per cell. Non-ribbon based technologies show none.
Number of cells in the shortest direction. E.g., 6, 8, 10
Number of cells in the longest direction. E.g., 10, 12, 20
Total number of junction boxes present on the module.
Number of cells in a group of solar panels connected in series in a module
Number of series connections present in the module. 1 if all cells in series, 2 or more otherwise.
Number of groups of solar panels connected in series in a module
Perminant deformation caused by fracture
Failure of a material by tensile stress normal to the plane of the crack, ie: opening
Failure of a material by shear stress parallel to the plane of the crack and parallel to the crack front, ie: tearing
Failure of a material by shear stress parallel to the plane of the crack and perpendicular ot the crack front, ie: sliding
The open circuit voltage measured by a current voltage process
Charge controller output voltage [A-dc].
Charge controller output voltage [V-dc].
Drying time in the evaporation process of film preparation.
Polymer backsheet of a PV cell or module
A PV module, comprised of cells, for field deployment
How PV modules are arranged within the system
Type of racking used (open, closed, roof, etc)
The specific method or setting used by the spectrometer to acquire spectral data from the sample.
Time the instrument takes for the readings
Water content in the air divided by maximum water held at that temperature.
The pattern which results from fatigue crack growth
Area of an invididual cell within a module that a current voltage process is being performed on
Resisitivity of the sample that a current voltage is being performed on
The process of collecting infrared spectral data from a sample by measuring the absorption at varoius wavelenghths.
Total area of the module that a current voltage process is being performed on
The saturation current density measured by a current voltage process
The detector's ability to accurately measure and respond to small amounts of infrared radiation.
The series resistance measured by a current voltage process
The short circuit current measured by a current voltage process
The shunt resistance measured by a current voltage process
The working range of the current of a simulator
The working range of the intensity of a simulator
Type of measurement a simulator is performing
The model of the solar simulator, i.e. FMT-350
The working range of the voltage of a simulator
A tool used to simulate the environment of a sun for a PV module, to perform a current voltage measurement
The identification number of a solar simulator
The manufacturer of a solar simulator, i.e. 'Sinton Instruments'
The name of a solar simulator, i.e. 'Lab 1 Simulator'
The range of infrared wavelengths the instrument measured
The cummulative time a batch or sample was in exposure.
A mark caused by a changing stress state
The established intensity of a current voltage process
A mark perpendicular to the direction of faitgue crack growth
Reduction of some percent of ISC per degree Celsius. Rate at which current changes in reponse to a change in temperature.
Reduction of some percent of PMP per degree Celsius. Rate at which power changes in reponse to a change in temperature.
Reduction of some percent of VOC per degree Celsius. Rate at which a voltage changes in reponse to a change in temperature.
Thickness of the module, not counting the framing
If system is tracking, method used (truetracking, backtracking, diffuse tracking, etc)
The voltage at max power measured by a current voltage process
DC voltage at the maximum power point of the cell
DC voltage at the maximum power point under STC
Module open circuit voltage, maximum voltage the module can provide
The amount a cell's output voltage changes due to temperature
Distinguishes whether the silicon wafer was manufactured as a single crystal, multiple crystals, or no crystal (amorphous); if not silicon, another value is used such as THIN FILM.
Doping polarity of absorber. E.g., n-type or p-type.
Doping type of the wafer that a current voltage process is being performed on
Point at which the Z-stop is set, minimum Z value.
An instrument that does atomic force microscopy (AFM)
Piezoelectric sensor location of the AFM instrument.
A tip used in an AFM instrument that scans across a sample
A process using statistical techniques to examine data to extract underlying relationships
Shape describing the interdigitated comb board
the force constant of the cantilever; depends on the material
the resonance frequency of the cantilever; depends on the material
Cell technology (PERC, TOPCon, Al-BSF, CdTe, CIGS, etc)
Value describing the cleanliness of the interdigitated comb
A recipe describing the settings for a current voltage process
Distance of the detector from the sample.
Facility where the experiment was performed.
Value describing the number of fingers an interdigitated comb posseses
Value describing the space between each finger of an interdigitated comb
hot stage for temperature dependent AFM experiments
temperature range of a hotstage in an AFM instrument
Identifier for each pattern of a board containing interdigitated combs
A company or entity that designs, produces, and supplies the instrument and its accessories.
Value describing the masking of an interdigitated comb
An algorithm that describes an underlying relationship between inputs and outputs
Type of a model (linear, regression, logistic, etc.)
Signifier of series or line of products.
Value describing the plating of an interdigitated comb
A set of specifications that describes how a process is carried out
The ability of the spectrometer to distinguish between closely spaced spectral features i.e smallest difference in wavenumbers.
A consequence, effect, or outcome of a process
Dimensions of a sample (if sample is solid)
Controls response time of the feedback loop; can dramatically affect the image quality and dependent on both the duration and magnitude of the error signal.
Size of samples that are within working range of an AFM instrument
Size of the AFM scan along one side of the square.
Controls the rate at which the cantilever scans the sample area.
The speed range in which the probe moves across a sample
A unique identifier assigned to each individual instrument.
Software used by the instrument to perform AFM technique
the computer programs used to control the instrument.
Particular beamline within the facility.
Value describing the material that the substrate on which the interdigitated combs lie on is composed of
The detector used to capture the transmitted X-rays.
The specific version or type of instrument.
Unique serial number of a tool (assigned by manufacturer)
Value describing the material that the finger traces are composed of
Wavelength(s) of light being used for analysis
The span of infrared wavelengths that the instrument can measure.