SDLE Research Center MDS-Onto combines concepts from all different the different ontologies in Materials Data Science MDS-Onto MDS-Onto 0.3.0.0 Broader concepts are typically rendered as parents in a concept hierarchy (tree). has broader Relates a concept to a concept that is more general in meaning. Person AFMChannel Speed of spin-coating. Absorbance absorbance read by instrument Accessory Accessory used for the measurement An additional component or device such as crystal, gas cell, or sample holder, that enhances or modifies the functionality of the instrument. AmbientTemperature Amplitude Drying temperature in the evaporation process of film preparation. BackgroundScans measurement of the infrared radiation for baseline correction. backsheet Material used to cover the rear of the module. E.g., TPT, Tedlar. BeamSplitter Multiple beamsplitter options are present such as KBr, XT-KBr, and Quartz Beamsplitter Multiple beamsplitter options are present such as KBr, XT-KBr, and Quartz Cantilever Cell cell-area Total cell surface area. Number of cells in a module The cell efficiency measured by a current voltage process A calibration setting that deteremines the irradiance level of a light source, typically determined by a reference cell cell-technology Technology used on the cell level, i.e., cell architecture. E.g., Al-BSF, PERC, PERT, MWT, IBC, SHJ. cells-per-string The number of cells in series together per individual string. E.g., 60, 72, etc. ChargeControllerType Charge controller type. ClimateZone connector-type Which version of lead connection is used to connect panel. E.g, MC4, MC3, T4. Correction The process of adjusting the spectral data to account for any instrumental factor like baseline correction. The current at max power measured by a current voltage process CurrentAtMaximumPower CurrentAtMaximumPower DC current at maximum power point DC current at the maximum power point under STC CurrentShortCircuit Module short circuit current Short-circuit current of the cell The analysis method used on a raw dataset generated by a current voltage process The raw current voltage data generated by a current voltage process The file path of a dataset generated by a current voltage process The author of a recipe for a current voltage process The creation date for a current voltage process recipe The file path for a current voltage process recipe The identification number for a current voltage recipe The parameters that resulted from the current voltage process The datetime when a current voltage process was executed A sample used in a current voltage process The step size of the voltage for a current voltage process DateImaged Detector A sensitive component that converts infrared radiation from the sample into an electrical signal for spectral analysis. Sofwtare used in the instrument DimensionsImage Type of solvent for thin-film preparation. Dimple Tipped structures resulting from ductile failure DriveAmplitude Elevation Elevation above sea level encapsulant Polymer material used to hold front sheet and back sheet together. Eg., EVA, POE, etc. Material of the polymer encapsulant EstimatedStressIntensityFactor An estimation of the stress amplification at the crack tip ExposureConditions The specific environmental factors and durations to which samples are subjected to before characterization. The step count of the exposure. The temperature set point of the chamber. The type of exposure e.g. damp heat, cyclic UV, outdoors. The ambient temperature of the room that a current voltage process is being performed in FieldOfView the field of view of an AFM scan The fill factor measured by a current voltage process FilmDimentions FilmPreparation The amount of time between flash pulses A UVF fluorescence pattern of a module FractographyImage FractographyImageCharacteristic frame-material Material used for the module frame. GainParameters Amplitude image from AFM instrument. Identifier InitiationSite Instrument A NicoletFTIR-OpticalSpectroscopy for chemical analysis An AgilentFTIR-OpticalSpectroscopy for chemical analysis interconnection-scheme Method used to wire cells together. RIBBON, SHINGLED, WIRE InterdigitatedComb Specimen subclass for an individual interdigitated comb Irradiance junction-box-locations Location on rear of module housing junction box(es). Location could be on module EDGE; CENTER or SPLIT are commonly seen on half-cell modules. Latitude North/south position of a point on the Earth, decimal format LightRange Range of light levels that can be used The amount of time data is acquired during flash pulses The standard testing condition load voltage of a sample being measured Longitude East/west position of a point on the Earth, decimal format make Manufacturer or creator of device. MaterialName The name of the sample MaterialType The type of material used as sample The maximum power point measured by a current voltage process Measurement Chemical analysis carried out on the sample. module-arc Front glass module anti-reflective coating. Boolean. module-area Total area of module surface in cm2. Theoretical efficency of a module Polymer encapsulant of a module Electrical junction box for connection to the module module-packaging The materials used for each layer of the solar panel excluding cell components. Either glass on glass (GG), glass with backsheet GB), glass with transparent backsheet (GTB). Measurements of a module taken at STC and 1000 W/m^2 irradiance ModuleRatingCondition Condition of the cell Condition of the module MountingType How the arrays are mounted (fixed, one axis tracker, two axis tracker, vertical, etc) nameplate-imp Current at maximum power point rated at STC. nameplate-isc Short-circuit current rated at STC nameplate-pmp Maximum power rated at STC. nameplate-vmp Voltage at maximum power point rated at STC. nameplate-voc Open-circuit voltage rated at STC NumScans Number of scans for each run number-busbars Number of busbars present per cell. Non-ribbon based technologies show none. cells-x Number of cells in the shortest direction. E.g., 6, 8, 10 cells-y Number of cells in the longest direction. E.g., 10, 12, 20 NumberInverters Number of inverters located at the site number-junction-box Total number of junction boxes present on the module. Number of cells in a group of solar panels connected in series in a module number-parallel-strings Number of series connections present in the module. 1 if all cells in series, 2 or more otherwise. Number of groups of solar panels connected in series in a module NumberofScan ObservedFailure Perminant deformation caused by fracture ObservedModeOneFailure Failure of a material by tensile stress normal to the plane of the crack, ie: opening ObservedModeThreeFailure Failure of a material by shear stress parallel to the plane of the crack and parallel to the crack front, ie: tearing ObservedModeTwoFailure Failure of a material by shear stress parallel to the plane of the crack and perpendicular ot the crack front, ie: sliding The open circuit voltage measured by a current voltage process OperatorName Term from the OrangeButton Taxonomy OutputCurrent Charge controller output voltage [A-dc]. OutputVoltage Charge controller output voltage [V-dc]. PersonORCiD Unique ID of a person Phase Drying time in the evaporation process of film preparation. Polymer backsheet of a PV cell or module PhotovoltaicCell PV cell that composes a module PhotovoltaicCellID Identifier for the PV cell PhotovoltaicCellProperty A property of a PV cell PhotovoltaicChargeController PhotovoltaicChargeControllerID Charge controller id. PhotovoltaicChargeControllerNote PhotovoltaicChargeControllerProperty PhotovoltaicInverter An inverter to convert DC to AC PhotovoltaicModule A PV module, comprised of cells, for field deployment Module identifier A property of a PV module PhotovoltaicRacking How PV modules are arranged within the system PhotovoltaicSite Physical location of a PV site PhotovoltaicSiteID Site identifier PhotovoltaicSiteNote PhotovoltaicSiteParameter Parameter or property a PV site has PlaneOfArrayIrradiance PowerDC DC power at STC, 1 sun of irradiance DC power produced by the cell Power at refrence conditions ProfilometryInsturment ProfilometryInsturmentID PyrometerInstrument PyrometerReading PyrometryInstrument PyrometryMonitor In situ monitor of print RackingType Type of racking used (open, closed, roof, etc) ReadMode ReadingMode The specific method or setting used by the spectrometer to acquire spectral data from the sample. ReadingSpeed readingTime Time the instrument takes for the readings ReadingSpeed ReadingTime Time the instrument takes for the readings Water content in the air divided by maximum water held at that temperature. RiverPattern The pattern which results from fatigue crack growth RollRange Range of roll motion Area of an invididual cell within a module that a current voltage process is being performed on Resisitivity of the sample that a current voltage is being performed on SampleScans The process of collecting infrared spectral data from a sample by measuring the absorption at varoius wavelenghths. Total area of the module that a current voltage process is being performed on The saturation current density measured by a current voltage process Sensitivity Equipment sensitivity The detector's ability to accurately measure and respond to small amounts of infrared radiation. Sensor The series resistance measured by a current voltage process The short circuit current measured by a current voltage process The shunt resistance measured by a current voltage process The working range of the current of a simulator The working range of the intensity of a simulator Type of measurement a simulator is performing The spational uniformity of a simulator The model of the solar simulator, i.e. FMT-350 The serial number of a solar simulator The working range of the voltage of a simulator A tool used to simulate the environment of a sun for a PV module, to perform a current voltage measurement The identification number of a solar simulator The manufacturer of a solar simulator, i.e. 'Sinton Instruments' The name of a solar simulator, i.e. 'Lab 1 Simulator' SpectralRange Spectral Range The range of infrared wavelengths the instrument measured The cummulative time a batch or sample was in exposure. Beach Mark Striation A mark caused by a changing stress state The established intensity of a current voltage process TearBand A mark perpendicular to the direction of faitgue crack growth temperature-coefficient-current Reduction of some percent of ISC per degree Celsius. Rate at which current changes in reponse to a change in temperature. temperature-coefficient-power Reduction of some percent of PMP per degree Celsius. Rate at which power changes in reponse to a change in temperature. temperature-coefficient-voltage Reduction of some percent of VOC per degree Celsius. Rate at which a voltage changes in reponse to a change in temperature. Thickness Thickness of the module, not counting the framing Thickness of the sample TiltRange Range of tilt motion TipRadius The radius of the AFM tip Title TrackingAlgorithm If system is tracking, method used (truetracking, backtracking, diffuse tracking, etc) Transmittance transmittance read by instrument VideoID The voltage at max power measured by a current voltage process VoltageAtMaximumPower DC voltage at the maximum power point of the cell DC voltage at the maximum power point under STC VoltageOpenCircuit Module open circuit voltage, maximum voltage the module can provide Open-circuit voltage of the cell The amount a cell's output voltage changes due to temperature wafer-crystallinity Distinguishes whether the silicon wafer was manufactured as a single crystal, multiple crystals, or no crystal (amorphous); if not silicon, another value is used such as THIN FILM. wafer-doping-polarity Doping polarity of absorber. E.g., n-type or p-type. Doping type of the wafer that a current voltage process is being performed on Module weight WindDirection WindSpeed XRange Range in the X direction of probe Range of motion along the X-axis YRange Range in the Y direction of the probe Range of motion along the Y-axis ZRange Range in the Z direction of the probe ZSensorNoise Noise level of the Z sensor ZStop Point at which the Z-stop is set, minimum Z value. Algorithm Date Department Distance Force Identifier Laboratory Length Manufacturer MeasuringDevice Metadata Method NodeSerialNumber NonTransformativeAnalysisProcess PrimaryData ProcessingNode ProjectIdentifier Sample SequenceNumber Temperature ValueObject Width AFMInstrument An instrument that does atomic force microscopy (AFM) Piezoelectric sensor location of the AFM instrument. AFMInstrumentModel Model of the AFM instrument AFMTip A tip used in an AFM instrument that scans across a sample Ad2 Analysis A process using statistical techniques to examine data to extract underlying relationships BoardType Shape describing the interdigitated comb board CantileverForceConstant the force constant of the cantilever; depends on the material CantileverMaterial the material of the AFM cantilever CantileverResonanceFrequency the resonance frequency of the cantilever; depends on the material CaptureRateMax CaptureRateMin Category CellCutType CellCutType CellTechnologyType CellTechnologyType Cell technology (PERC, TOPCon, Al-BSF, CdTe, CIGS, etc) Cleanliness Value describing the cleanliness of the interdigitated comb A recipe describing the settings for a current voltage process Date Department DetectionWavelength DetectorLength Length of the detector. DetectorName Name of the detector. DetectorType DetectorWidth Width of the detector. Distance DistanceFromSample Distance of the detector from the sample. Energy The energy of the incident beam. EnergyUsed ExposureTime Facility Facility where the experiment was performed. FileExtension FilePath FilterType FingerAmount Value describing the number of fingers an interdigitated comb posseses FocalDistance Force FrameRate Gap Value describing the space between each finger of an interdigitated comb Geometry HatchDistance HotStage hot stage for temperature dependent AFM experiments HotStageDiameter HotStageTemperature temperature range of a hotstage in an AFM instrument ImageSequence Running sequence of the image taken. InstrumentID InstrumentName IntegralGrain Phase image from AFM instrument. Intensity InterdigitatedCombIdentifier Identifier for each pattern of a board containing interdigitated combs Laboratory Length Length of the module along longest side Length of the sample LogFile Contains log of the results. Magnification Manufacturer A company or entity that designs, produces, and supplies the instrument and its accessories. Manufacturer of the instrument Masking Value describing the masking of an interdigitated comb MeasuringDevice Metadata MetadataFormat Model An algorithm that describes an underlying relationship between inputs and outputs ModelFilePath File path unique to a model ModelID Unique ID of a model ModelName Human-readable, English name of a model ModelResults Results of a model ModelType Type of a model (linear, regression, logistic, etc.) NodeSerialNumber Objective Objective lens, ex: 5X, 20X Person model Signifier of series or line of products. PiezoelectricSensor PiezoelectricSensorLocation Dimension of the fluoroelastomer film. PixelSize Pixel size of the detector. PlateNumber A subcomponent of an occurent Plating Value describing the plating of an interdigitated comb Position Position of --- Power PreFiltration PrimaryData ProfilometryModel Model of the insturment being used ProjectIdentifier Recipe A set of specifications that describes how a process is carried out RecipeAuthor Person created a recipe RecipeCreatedDate Date that a recipe is created RecipeFilePath File path unique to a recipe RecipeID Unique ID for a recipe RecipeModifiedDate Date that a recipe is modified Resolution The ability of the spectrometer to distinguish between closely spaced spectral features i.e smallest difference in wavenumbers. ResonanceFrequency Solvent concentration. Result A consequence, effect, or outcome of a process ResultID Unique ID of a result RunEndDate RunStartDate Sample SampleDate Date that a sample was created SampleDimension Dimensions of a sample (if sample is solid) SampleID Controls response time of the feedback loop; can dramatically affect the image quality and dependent on both the duration and magnitude of the error signal. Unique ID of a sample SampleRate output sampling rate SampleSize Size of samples that are within working range of an AFM instrument Scale ScanAngle Angle at which the scanning occurs. ScanLines ScanParameters Size of the AFM scan along one side of the square. ScanRate Controls the rate at which the cantilever scans the sample area. ScanSpeed The speed range in which the probe moves across a sample SensorPosition Coaxial vs concentric SensorType Wavelength range SequenceNumber SerialNumber A unique identifier assigned to each individual instrument. Serial numer of the instrument SetPoint Cleaning process of the substrate. Size Software Software used by the instrument to perform AFM technique Software used in the instrument the computer programs used to control the instrument. Solvent SolventType SpincoaterInstrument SpincoatingParameters SpotSize StackNumber The stack of the data. Station Particular beamline within the facility. Substrate SubstrateDimensions SubstrateMaterial Value describing the material that the substrate on which the interdigitated combs lie on is composed of SubstrateType SyncXrayDetector The detector used to capture the transmitted X-rays. Temperature TipMaterial The material of the AFM tip Tool ToolCalibrationDate Date that a tool is calibrated ToolCalibrationPerson Person that calibrated a tool ToolCalibrationResults Results of a calibration of a tool ToolID Unique ID of a tool ToolManufacturer Manufacturer of a tool Model ToolModel Model of a tool The specific version or type of instrument. ToolSerialNo Unique serial number of a tool (assigned by manufacturer) ToolSoftware Software used by a tool TraceMaterial Value describing the material that the finger traces are composed of Turn Wavelength The wavelength used for the experiment. Wavelength(s) of light being used for analysis wavelength of reading WavelengthRange The span of infrared wavelengths that the instrument can measure. Width Width of module along shortest side Width of the sample ZCoordinate ZSensor